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1 Research on Test Verification Index system of New Generation Electronic equipment [会议论文]

作者:Yang, Jinpeng^1;Lian, Guangyao^2;Wang, Junxian^3;等

关键词:Comprehensive evaluation;Electronic systems;...

会议举办机构:Army Engineering University, Shijiazhuang, China^1

会议时间:2018

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